Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Journal article

Authors/Editors

POOM KUMAM

Strategic Research Themes

Other (Strategic Research Themes)

Publication Details

Author list: Charongrattanasakul, Pramote; Bamrungsetthapong, Wimonmas; Kumam, Poom;

Publication year: 2023

Volume number: 46

Issue number: 2

Start page: 1631

End page: 1651

Number of pages: 21

ISSN: 02676192

URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85148211429&doi=10.32604%2fcsse.2023.036179&partnerID=40&md5=b873f51663b6f35efd9e7616f2791bd9

Languages: English-Great Britain (EN-GB)

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Abstract

A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the ALT. A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number (ASN) and total cost of inspection (TC) under both producer’s and consumer’s risks. Numerical results are presented to support the AMDSSP for the ALT, while performance comparisons between the AMDSSP, the MDSSP and a single sampling plan (SSP) for the ALT are discussed. Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions. The AMDSSP also had a higher operating characteristic (OC) curve than both the existing sampling plans. Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan. © 2023 CRL Publishing. All rights reserved.

Keywords

Accelerated life test, acceleration factor, adaptive of multiple dependent state sampling plan, average sample number, total cost of inspection