Advances in PV Measurement Traceability for High-Performance Modules in Thailand

Key developments in the PV industry include bifacial crystalline silicon technologies such as Passivated Emitter and Rear Cell (PERC), Tunnel Oxide Passivated Contact (TOPCon), and Heterojunction with Intrinsic Thin Layer (HJT). In parallel, the International Electrotechnical Commission (IEC) has updated relevant standards to address emerging measurement challenges. Capacitive PV devices must be measured without errors arising from the technology-specific characteristics of each device. Traceability of measurements is essential for accurate PV characterization, including both the light source and the measurement instrumentation. As a result, requirements related to measurement uncertainty and laboratory accreditation have been established to ensure reliability and consistency across PV performance measurements