Determination of the Optical Constants and Thickness of Reactive Sputtered TIO2 Thin Films by Envelope Method

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Author listWitit-anun, N.;Rakkwamsuk, P.;Limsuwan, P.

Publication year2009

Journalวารสารวิทยาศาสตร์บูรพา (2351-0781)

Volume number14

Issue number1

Start page26

End page35

ISSN2351-0781


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Last updated on 2022-06-01 at 15:28