Identifying priority areas for the conservation of the Critically Endangered northern white-cheeked gibbon Nomascus leucogenys in northern Lao
Conference proceedings article
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Publication Details
Author list: Syxaiyakhamthor K., Ngoprasert D., Asensio N., Savini T.
Publisher: Hindawi
Publication year: 2019
ISBN: 9781728133614
ISSN: 0146-9428
eISSN: 1745-4557
Languages: English-Great Britain (EN-GB)
Abstract
This paper presents anti-reflection coating designs and simulation on the Si-based photonic devices used in the optical communication. The simulations were performed to determine the reflectance spectrum of the single-layer and double-layer thin-film coatings. Several coating materials were chosen in simulation to obtain the best solution for light reflection reduction within the wavelengths of 1200-1600nm. The simulation results showed that the single-layer of SiO2 thin- film yielded the reflectance value less than 7%, which was over 20% improvement from an uncoated sample. While, the double- layer anti-reflection coating of ZnSe/LiF showed the promising results of reflectivity less than 0.03% over the wavelengths of 1200-1600nm, which cover all the FTTx wavelength bands. Thus, the proposed ARC structure has the potential to be employed for light reflection reduction for Si-based photonic devices in optical communication networks and optical sensors. ฉ 2019 IEEE.
Keywords
Anti reflection coating (ARC), Reflectance, Silicon-based photonic devices