Similarity Measurement of Symbols on Embossed Surfaces

Conference proceedings article


Authors/Editors


Strategic Research Themes


Publication Details

Author listSupakit Suksawat and Werapon Chiracharit

Publication year2021

Title of seriesThe 18th KU KPS National Conference

Start page744

End page750

Number of pages7

LanguagesThai (TH)


Abstract

At present, in the age of Industry 4.0, digital technology has been applying for automated quality control. This paper presents visual inspection on product surface embossed with industrial symbols. Image processing-based measurements of similarity of the symbol images were proposed. Peak signal-to-noise ratio (PSNR), the structural similarity index measure (SSIM), and correlation coefficient were evaluated and compared. The experimental results show that the proposed similarity indexes are efficiently enough to identify the symbols on embossed surfaces.


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Last updated on 2024-19-02 at 23:05