A study of the effects of mobile ion migration on opto-electronic characterizations of perovskite solar cells using the numerical drift-diffusion simulation, including time-dependent ion-mediated trap states

The current consensus agrees that mobile ion migration is an intrinsic adverse property in perovskite solar cells. The phenomenon causes hysteresis, performance loss, and degradation. However, it is much less understood how ion migration affects opto-electronic device characterizations, such as space-charge-limited current (SCLC) and open-circuit voltage decay (OCVD). The most important effects that need explaining are ionic-electronic coupling and ion-mediated trap-assisted recombination. Hence, we propose implementing the effects into a numerical drift-diffusion simulation to gain a fundamental knowledge regarding the roles of ion migration in device characterizations. We argue that ion migration is the origin of hysteresis in SCLC measurements, long and non-linear decaying time in OCVD, and errors in interpreting characterization results. Ultimately, the goal of this project is gaining necessary knowledge for strategic developments of high-efficient and stable perovskite solar cells in Thailand. We will also distribute our simulation package to the research community, so Thai researchers can make use of it to gain insights into fundamental knowledge from their laboratory results and be able to develop workable perovskite solar cells in the future.