Integrated Electroluminescence and Image Processing for Crack Expansion in PV Modules under Dynamic Mechanical Load Testing

Conference proceedings article


ผู้เขียน/บรรณาธิการ


กลุ่มสาขาการวิจัยเชิงกลยุทธ์


รายละเอียดสำหรับงานพิมพ์

รายชื่อผู้แต่งPanusorn Polchai, Yaowanee Sangpongsanont, Manit Seapan, Tanokkorn Chenvidhya, Krissanapong Kirtikara, Dhirayut Chenvidhya, Kittipob Wiriyavorawet

ปีที่เผยแพร่ (ค.ศ.)2026

ชื่อชุดPVSEC-36, 2025 PROCEEDINGS The 36th International Photovoltaic Science and Engineering Conference

เลขในชุด-

Volume number-

หน้าแรก103

หน้าสุดท้าย104

จำนวนหน้า2


ดูบนเว็บไซต์ของสำนักพิมพ์


บทคัดย่อ

The deployment of photovoltaic (PV) systems has experienced substantial expansion. To improve efficiency and decrease manufacturing expenses, PV module technologies are progressing, especially by minimizing the thickness of crystalline silicon. This has necessitated the amendment of IEC61215:2021 to incorporate the Dynamic Mechanical Load Test (MQT 20), which assesses the mechanical durability of modules by 1,000 cycles of cyclic loading. The acceptance requirements stipulate the absence of visible damage and no substantial decline in electrical performance. Nonetheless, imperfections like microcracks may remain undetectable during conventional examinations. This work seeks to investigate fracture features on photovoltaic modules subjected to MQT 20, utilizing electroluminescence (EL) imaging and Python image processing to evaluate damage over time. Preliminary findings indicate a fissure of 15.7 cm following 100 cycles. The suggested technique assists in assessing PV modules subjected to mechanical stress, hence enhancing standards and module design.


คำสำคัญ

Dynamic mechanical analysisElectroluminescence (EL)Image processingSolar photovoltaic


อัพเดทล่าสุด 2026-14-02 ถึง 00:00