Integrated Electroluminescence and Image Processing for Crack Expansion in PV Modules under Dynamic Mechanical Load Testing
Conference proceedings article
Authors/Editors
Strategic Research Themes
Publication Details
Author list: Panusorn Polchai, Yaowanee Sangpongsanont, Manit Seapan, Tanokkorn Chenvidhya, Krissanapong Kirtikara, Dhirayut Chenvidhya, Kittipob Wiriyavorawet
Publication year: 2026
Title of series: PVSEC-36, 2025 PROCEEDINGS The 36th International Photovoltaic Science and Engineering Conference
Number in series: -
Volume number: -
Start page: 103
End page: 104
Number of pages: 2
Abstract
The deployment of photovoltaic (PV) systems has experienced substantial expansion. To improve efficiency and decrease manufacturing expenses, PV module technologies are progressing, especially by minimizing the thickness of crystalline silicon. This has necessitated the amendment of IEC61215:2021 to incorporate the Dynamic Mechanical Load Test (MQT 20), which assesses the mechanical durability of modules by 1,000 cycles of cyclic loading. The acceptance requirements stipulate the absence of visible damage and no substantial decline in electrical performance. Nonetheless, imperfections like microcracks may remain undetectable during conventional examinations. This work seeks to investigate fracture features on photovoltaic modules subjected to MQT 20, utilizing electroluminescence (EL) imaging and Python image processing to evaluate damage over time. Preliminary findings indicate a fissure of 15.7 cm following 100 cycles. The suggested technique assists in assessing PV modules subjected to mechanical stress, hence enhancing standards and module design.
Keywords
Dynamic mechanical analysis, Electroluminescence (EL), Image processing, Solar photovoltaic






