Investigation of small electrical resistance of NiTi shape memory alloys in the application of damage detection

Conference proceedings article

ผู้เขียน/บรรณาธิการ

กลุ่มสาขาการวิจัยเชิงกลยุทธ์

ไม่พบข้อมูลที่เกี่ยวข้อง

รายละเอียดสำหรับงานพิมพ์

รายชื่อผู้แต่ง: Chatwaranon C., Wongsa S., Buasri T., Khantachawana A.

ผู้เผยแพร่: Hindawi

ปีที่เผยแพร่ (ค.ศ.): 2013

ISBN: 9781479905454

นอก: 0146-9428

eISSN: 1745-4557

URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84883066738&doi=10.1109%2fECTICon.2013.6559648&partnerID=40&md5=3f30e766b80c901fc37f6d6c5d23aa2b

ภาษา: English-Great Britain (EN-GB)

ดูบนเว็บไซต์ของสำนักพิมพ์

บทคัดย่อ

Applications of shape memory alloys (SMAs) as damage sensors have been widely studied in structural health monitoring. Monitoring a significant change in electrical resistance of SMAs can indicate the phase transformation of SMAs. The possibility of using the electrical resistance of SMAs as an indicator of damage in the materials has been investigated. We continuously monitored the behaviour of electrical resistance, as well as the strain, under the tensile test which is used as the simulated crack propagation. Wavelet transform were used to extract the trend of the noisy electrical resistance raw data, measured by the four-point-probe technique. We determined that the electrical resistance variation of the SMA wire is correlated with the strain and can possibly be used in damage detection stage. ฉ 2013 IEEE.

คำสำคัญ

Discrete Wavelet Transform, Electrical Monitoring, Shape Memory Alloys, Trend Extraction