Polarization Phase-shifting Technique for the Determination of a Transparent Thin Film's Thickness Using a Modified Sagnac Interferometer

Journal article

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Publication Details

Author list: Kaewon, R; Pawong, C; Chitaree, R; Bhatranand, A

Publisher: OPTICAL SOC KOREA

Publication year: 2018

Volume number: 2

Issue number: 5

Start page: 474

End page: 481

Number of pages: 8

ISSN: 2508-7266

eISSN: 2508-7274

Languages: English-Great Britain (EN-GB)

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Abstract

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Keywords

Polarization phase-shifting technique, Rotating polarized light, Sagnac interferometer, Thin-film thickness measurement, Transparent thin films