Refractive Index Finding using Multiple Light Reflections with Modified Sagnac Interferometer

Conference proceedings article

ผู้เขียน/บรรณาธิการ

กลุ่มสาขาการวิจัยเชิงกลยุทธ์

รายละเอียดสำหรับงานพิมพ์

รายชื่อผู้แต่ง: Usman, Abdullahi; Bhatranand, Apichai; Jiraraksopakun, Yuttapong; Kaewon, Rapeepan; Pawong, Chutchaic;

ผู้เผยแพร่: Taiwan Association for Aerosol Research

ปีที่เผยแพร่ (ค.ศ.): 2022

หน้าแรก: 1

หน้าสุดท้าย: 4

จำนวนหน้า: 4

ISBN: 9781665402064

นอก: 1680-8584

eISSN: 2071-1409

URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85128164119&doi=10.1109%2fiEECON53204.2022.9741591&partnerID=40&md5=a5a4ab59dda22cd83b19b85cbe0d085f

ภาษา: English-Great Britain (EN-GB)

ดูบนเว็บไซต์ของสำนักพิมพ์

บทคัดย่อ

Refractive index finding using multiple light reflections with modified Sagnac interferometer is proposed here. The thickness of the material and fringes pattern are fundamental parameters in such measurement. In this proposed technique, multiple light reflections, by the two parallel mirrors attached to a piezo-electric transducer (PZT) vibrating at a frequency of 420Hz, introduced the phase retardation. The phase retardation and reflected angles could be found and employed for refractive index determination. Four identical interferograms were obtained by a half-wave plate (HWP) oriented at 0, p/2, p and 3p/2 rad with respect to the incident plane. The intensities at their respective patterns were evaluated and the phase shift could be computed. Using numerous reflections with a Sagnac interferometer, this technique is presented to obtain multiple fringes with a sample fixed in position at certain carrier frequencies. © 2022 IEEE.

คำสำคัญ

interferogram, multiple-reflections