Refractive Index Finding using Multiple Light Reflections with Modified Sagnac Interferometer

Conference proceedings article

Authors/Editors

Strategic Research Themes

High Performance Computing (Computational Science and Engineering)

Publication Details

Author list: Usman, Abdullahi; Bhatranand, Apichai; Jiraraksopakun, Yuttapong; Kaewon, Rapeepan; Pawong, Chutchaic;

Publisher: Taiwan Association for Aerosol Research

Publication year: 2022

Start page: 1

End page: 4

Number of pages: 4

ISBN: 9781665402064

ISSN: 1680-8584

eISSN: 2071-1409

URL: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85128164119&doi=10.1109%2fiEECON53204.2022.9741591&partnerID=40&md5=a5a4ab59dda22cd83b19b85cbe0d085f

Languages: English-Great Britain (EN-GB)

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Abstract

Refractive index finding using multiple light reflections with modified Sagnac interferometer is proposed here. The thickness of the material and fringes pattern are fundamental parameters in such measurement. In this proposed technique, multiple light reflections, by the two parallel mirrors attached to a piezo-electric transducer (PZT) vibrating at a frequency of 420Hz, introduced the phase retardation. The phase retardation and reflected angles could be found and employed for refractive index determination. Four identical interferograms were obtained by a half-wave plate (HWP) oriented at 0, p/2, p and 3p/2 rad with respect to the incident plane. The intensities at their respective patterns were evaluated and the phase shift could be computed. Using numerous reflections with a Sagnac interferometer, this technique is presented to obtain multiple fringes with a sample fixed in position at certain carrier frequencies. © 2022 IEEE.

Keywords

interferogram, multiple-reflections